MEMRISTORS 2026

S5 Materials, fabrication and processes

Tue, 30/06/2026
15:30 - 16:45
Sala de Graus Eduard Fontseré
S5

Chaired by:
Prof. Antonio Calomarde (Universitat Politècnica de Catalunya , Spain)

Interface Engineering in MAPbBr3 Memristors. Comparative Roles of PMMA and AgI on Switching Stability
*B. Arredondo (Universidad Rey Juan Carlos), J. Pérez-Martínez (Universidad Rey Juan Carlos), D. Martín-Martín (Universidad Rey Juan Carlos), B. Romero Herreo (Universidad Rey Juan Carlos), Á. Álvarez (Universidad Rey Juan Carlos), A. Guerrero (Universidad Jaume I)
Voltage-Controlled Degradation in Hafnia-Based Resistive Switching Devices
*C. Ferreyra (IMB-CNM-CSIC), Z. Su (IMB-CNM-CSIC), F. Campabadal (IMB-CNM-CSIC), E. Miranda (UAB), M. Bargalló González (IMB-CNM-CSIC)
Failure mechanisms in TiN/Ti/HfO₂/W memristors: effects of polarity, environment and scaling
*M. Saludes (IMB-CNM CSIC), F. Campabadal (IMB-CNM CSIC), E. Miranda (UAB), M. Bargalló (IMB CNM CSIC)